SEM
EPI Materials Testing Group maintains a state-of-the-art Scanning Electron Microscope (SEM) for examinations of specimens at high magnifications. It is combined with a fully digital imaging system that allows for documentation of microscopic features and attributes of the sample. The SEM is also supported by an advanced light element detector which hosts many support features: line scanning, mapping, image analysis, phase imaging.

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EPI Materials Testing Group
9391 Grogans Mill Rd
Suite A-6
The Woodlands, TX 77380

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toll-free: 1.877.374.6841
tel: 281.363.9997
fax: 281.296.8720

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